The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2016
Filed:
Oct. 31, 2014
Cadence Design Systems, Inc., San Jose, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Brion L. Keller, Binghamton, NY (US);
Steven M. Douskey, Rochester, MN (US);
Mary Kusko, Hopewell Junction, NY (US);
CADENCE DESIGN SYSTEMS, INC., San Jose, CA (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
SOC and other chip designs increasingly feature IP cores, and many copies of the same core may be present in a single chip. Using wrapped cores, it is possible to determine which cores are defective on a chip during test. Multiple instances of identical cores may be tested in parallel to easily determine which cores are failing. The cores compare a signature generated during test of the core against an expected signature, having a pass/fail bit as a result. The pass/fail bits may be multiplexed at an output pin where output pins are at a premium relative to the number of core instances or the pass/fail bit stored in a register to be later serially-unloaded from the chip. The disclosed embodiments provide for masking circuitry, as well as both identical and different core instances to be run serially and in parallel.