The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9396949 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 19, 2016

Filed:

Sep. 30, 2013
Applicant:

Peking University, Beijing, CN;

Inventors:

Ming Li, Beijing, CN;

Jiewen Fan, Beijing, CN;

Jia Li, Beijing, CN;

Xiaoyan Xu, Beijing, CN;

Ru Huang, Beijing, CN;

Assignee:

Peking University, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/225 (2006.01); H01L 21/00 (2006.01); H01L 29/06 (2006.01); H01L 29/66 (2006.01); H01L 29/10 (2006.01); H01L 29/78 (2006.01); H01L 29/775 (2006.01);
U.S. Cl.
CPC ...
H01L 21/2252 (2013.01); H01L 21/00 (2013.01); H01L 29/0673 (2013.01); H01L 29/105 (2013.01); H01L 29/66795 (2013.01); H01L 29/7855 (2013.01); H01L 29/775 (2013.01);
Abstract

The present invention discloses a method of adjusting a threshold voltage of a multi-gate structure device, wherein, preparing the multi-gate structure device to be formed to have a channel impurity distribution with high doping on surface and lowly doping inside, where while a threshold voltage is adjusted by using impurity doping, the influences of the Coulomb impurity scattering on the carriers is reduced as much as possible, so that the mobility of the carriers is maintained at a higher level. Firstly, the present solution is able to make a multi-gate device obtain a larger range of a multi-threshold voltage; it is convenient for the various demands of the device in the circuit designing by IC designers. Secondly, in the course of introducing the impurity doping to adjust a threshold voltage, the influences of the Coulomb impurity scattering on the channel carrier are reduced as much as possible, so that the mobility of the charge carriers is maintained at a higher level, and the device is ensured to have a higher drive current. Finally, the present solution is achieved by the process method compatible with a conventional CMOS, and has the potential for a large scale production.


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