The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2016

Filed:

Feb. 02, 2012
Applicants:

Tetsuya Oka, Annaka, JP;

Koji Ebara, Annaka, JP;

Shuji Takahashi, Annaka, JP;

Inventors:

Tetsuya Oka, Annaka, JP;

Koji Ebara, Annaka, JP;

Shuji Takahashi, Annaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 21/322 (2006.01); C30B 29/06 (2006.01); C30B 33/02 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02027 (2013.01); C30B 29/06 (2013.01); C30B 33/02 (2013.01); H01L 21/3225 (2013.01); Y10T 428/24355 (2015.01);
Abstract

A method for manufacturing a silicon substrate, including: performing a rapid heat treatment to a silicon substrate with a rapid-heating and rapid-cooling apparatus by maintaining the silicon substrate at a temperature that is higher than 1300° C. and not greater than a silicon melting point for 1 to 60 seconds, the silicon substrate being sliced from a silicon single crystal ingot grown by the Czochralski method; performing a first temperature decrease process down to a temperature in the range of 600 to 800° C. at a temperature decrease rate of 5 to 150° C./sec; and performing a second temperature decrease process in such a manner that a cooling time of X seconds and a temperature decrease rate of Y° C./sec meet Y≦0.15X-4.5 when X<100 and meet Y≦10 when X≧100.


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