The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2016

Filed:

Sep. 30, 2014
Applicant:

Cadence Design Systems, Inc., San Jose, CA (US);

Inventors:

Igor Keller, Pleasanton, CA (US);

Jijun Chen, San Jose, CA (US);

Pradeep Yadav, Greater Noida, IN;

Assignee:

CADENCE DESIGN SYSTEMS, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5031 (2013.01); G06F 2217/84 (2013.01);
Abstract

A system and method for performing multi-mode multi-corner (MMMC) analysis such that multiple views or conditions can be analyzed together to improve runtime by taking advantage of common steps of analysis in different corners. Views are clustered based on their similarity to one another to take advantage of calculations and other tasks that may be shared between views during timing analysis. Then, during timing analysis, each net in the design is analyzed for each view.


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