The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2016

Filed:

Aug. 28, 2015
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Erwin John Van Zwet, Pijnacker, NL;

Pieter Willem Herman De Jager, Middelbeers, NL;

Johannes Onvlee, 's-Hertogenbosch, NL;

Erik Christiaan Fritz, The Hague, NL;

Assignee:

ASML NETHERLANDS B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/32 (2006.01); G03B 27/54 (2006.01); G03F 7/20 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70366 (2013.01); G03F 7/704 (2013.01); G03F 7/70275 (2013.01); G03F 7/70391 (2013.01); G03F 7/70491 (2013.01); G03F 7/70883 (2013.01);
Abstract

A lithographic apparatus having an optical column capable of creating a pattern on a target portion of a substrate is disclosed. The optical column may have a self-emissive contrast device configured to emit a beam, and a projection system configured to project the beam onto the target portion. The apparatus may also have an actuator to move the optical column or a part thereof with respect to the substrate. The apparatus may be constructed to reduce the optical effect of density variation in a medium around the moving part of the optical column on the beam.


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