The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2016

Filed:

Jul. 09, 2015
Applicants:

Tsung Chuan Whang, Cupertino, CA (US);

Yi-chieh Wang, Taichung, TW;

Inventors:

Tsung Chuan Whang, Cupertino, CA (US);

Yi-Chieh Wang, Taichung, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/48 (2006.01); H01L 25/18 (2006.01); H01L 25/00 (2006.01); H01L 27/02 (2006.01); H01L 23/60 (2006.01); H01L 23/00 (2006.01); H01L 25/065 (2006.01);
U.S. Cl.
CPC ...
H01L 21/4825 (2013.01); H01L 23/60 (2013.01); H01L 24/05 (2013.01); H01L 24/85 (2013.01); H01L 25/0657 (2013.01); H01L 25/18 (2013.01); H01L 25/50 (2013.01); H01L 27/0255 (2013.01); H01L 24/73 (2013.01); H01L 2224/02379 (2013.01); H01L 2224/02381 (2013.01); H01L 2224/04042 (2013.01); H01L 2224/05568 (2013.01); H01L 2224/05569 (2013.01); H01L 2224/32145 (2013.01); H01L 2224/48091 (2013.01); H01L 2224/48145 (2013.01); H01L 2224/48149 (2013.01); H01L 2224/48227 (2013.01); H01L 2224/49 (2013.01); H01L 2224/73265 (2013.01); H01L 2224/85 (2013.01); H01L 2224/85007 (2013.01); H01L 2225/0651 (2013.01); H01L 2225/06506 (2013.01); H01L 2225/06527 (2013.01); H01L 2225/06568 (2013.01); H01L 2924/00014 (2013.01); H01L 2924/1203 (2013.01); H01L 2924/1207 (2013.01); H01L 2924/12036 (2013.01); H01L 2924/13091 (2013.01); H01L 2924/141 (2013.01); H01L 2924/143 (2013.01); H01L 2924/15311 (2013.01); H01L 2924/37001 (2013.01);
Abstract

A method for assembling multiple integrated circuit dies into a system-in-package chip is disclosed, the method comprising: providing a plurality of integrated circuit dies; disposing at least one redistribution layer on at least one of the plurality of integrated circuit dies for making wire connections among the plurality of integrated circuit dies without using a substrate underneath the plurality of integrated circuit dies; establishing wire connections among the plurality of integrated circuit dies and verifying the plurality of wire connections; and packaging the plurality of integrated circuit dies and the verified wire connections into a system-in-package chip.


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