The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2016

Filed:

Oct. 30, 2014
Applicant:

Nuflare Technology, Inc., Yokohama, JP;

Inventors:

Ryoichi Yoshikawa, Kanagawa, JP;

Munehiro Ogasawara, Kanagawa, JP;

Assignee:

Nuflare Technology, Inc., Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/263 (2006.01); H01J 37/317 (2006.01); H01J 37/302 (2006.01); B82Y 10/00 (2011.01); B82Y 40/00 (2011.01); H01L 21/308 (2006.01);
U.S. Cl.
CPC ...
H01J 37/3177 (2013.01); B82Y 10/00 (2013.01); B82Y 40/00 (2013.01); H01J 37/3026 (2013.01); H01J 37/3174 (2013.01); H01L 21/263 (2013.01); H01L 21/2633 (2013.01); H01L 21/3085 (2013.01); H01J 2237/31764 (2013.01); H01J 2237/31766 (2013.01);
Abstract

In accordance with one aspect of this invention, a multi charged particle beam writing apparatus includes an aperture member, in which a plurality of openings are formed, configured to form multi-beams by making portions of the charged particle beam pass through the plurality of openings; a plurality of blankers configured to perform blanking-deflect regarding beams corresponding to the multi-beams; a writing processing control unit configured to control writing processing with a plurality of beams having passed through different openings among the plurality of openings being irradiated on the target object at a predetermined control grid interval; and a dose controlling unit configured to variably control a dose of a beam associated with deviation according to a deviation amount when an interval between the plurality of beams irradiated is deviated from the control grid interval.


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