The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2016
Filed:
Mar. 27, 2012
Takeshi Yaguchi, Saitama, JP;
Hajime Sugimura, Saitama, JP;
Takahiro Nakajima, Gunma, JP;
Toshiaki Adachi, Gunma, JP;
Takeshi Yaguchi, Saitama, JP;
Hajime Sugimura, Saitama, JP;
Takahiro Nakajima, Gunma, JP;
Toshiaki Adachi, Gunma, JP;
ADVANTEST CORPORATION, Tokyo, JP;
Abstract
In order to efficiently test a plurality of types of devices under test, provided is a test apparatus that tests a device under test, comprising one or more test modules that each include a plurality of testing sections testing the device under test by exchanging signals with the device under test; and a plurality of control apparatuses that control operation of the testing sections. In each of the one or more test modules, the plurality of testing sections are each allocated to one of the plurality of control apparatuses, and each of the control apparatuses is capable of executing a test program managed by a different user, and controls operation of the testing sections allocated thereto.