The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2016

Filed:

Mar. 13, 2014
Applicants:

Michael B. Vincent, Chandler, AZ (US);

Zhiwei Gong, Chandler, AZ (US);

Jason R. Wright, Chandler, AZ (US);

Inventors:

Michael B. Vincent, Chandler, AZ (US);

Zhiwei Gong, Chandler, AZ (US);

Jason R. Wright, Chandler, AZ (US);

Assignee:

FREESCALE SEMICONDUCTOR INC., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/44 (2006.01); H01L 23/66 (2006.01); H01L 21/768 (2006.01); H01L 21/56 (2006.01); H01L 21/78 (2006.01); H01L 23/31 (2006.01); H01L 25/00 (2006.01); H01L 25/16 (2006.01); H01L 21/48 (2006.01); H01L 23/538 (2006.01); H01L 21/683 (2006.01); H01L 23/498 (2006.01); H01L 23/532 (2006.01);
U.S. Cl.
CPC ...
H01L 23/66 (2013.01); H01L 21/4853 (2013.01); H01L 21/565 (2013.01); H01L 21/568 (2013.01); H01L 21/6836 (2013.01); H01L 21/76838 (2013.01); H01L 21/76841 (2013.01); H01L 21/78 (2013.01); H01L 23/3107 (2013.01); H01L 23/49883 (2013.01); H01L 23/5383 (2013.01); H01L 25/16 (2013.01); H01L 25/50 (2013.01); H01L 23/49816 (2013.01); H01L 23/5328 (2013.01); H01L 23/5389 (2013.01); H01L 2221/68372 (2013.01); H01L 2223/6677 (2013.01); H01L 2224/04105 (2013.01); H01L 2224/05548 (2013.01); H01L 2224/12105 (2013.01); H01L 2224/18 (2013.01); H01L 2224/24145 (2013.01); H01L 2224/24225 (2013.01); H01L 2224/32145 (2013.01); H01L 2224/32153 (2013.01); H01L 2224/32221 (2013.01); H01L 2224/73267 (2013.01); H01L 2924/19041 (2013.01); H01L 2924/19042 (2013.01); H01L 2924/19043 (2013.01); H01L 2924/19104 (2013.01);
Abstract

Methods for fabricating microelectronic packages, such as Fan-Out Wafer Level Packages, and microelectronic packages are provided. In one embodiment, the method includes placing a first semiconductor die on a temporary substrate, forming an electrically-conducive trace in contact with at least one of the first semiconductor die and the temporary substrate, and encapsulating the first semiconductor die and the electrically-conductive trace within a molded panel. The temporary substrate is removed to reveal a frontside of the molded panel through which the electrically-conducive trace is at least partially exposed. At least one redistribution layer is formed over the frontside of the molded panel, the at least one redistribution layer comprises an interconnect line in ohmic contact with the electrically-conducive trace.


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