The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9318533 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 19, 2016

Filed:

Aug. 18, 2014
Applicant:

Sandisk 3d Llc, Milpitas, CA (US);

Inventors:

Pankaj Kalra, Santa Clara, CA (US);

Chandrasekhar Gorla, Cupertino, CA (US);

Masaaki Higashitani, Cupertino, CA (US);

Assignee:

SANDISK 3D LLC, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 27/24 (2006.01); H01L 45/00 (2006.01); H01L 49/02 (2006.01); H01L 29/786 (2006.01);
U.S. Cl.
CPC ...
H01L 27/2481 (2013.01); H01L 27/2409 (2013.01); H01L 45/04 (2013.01); H01L 45/146 (2013.01); H01L 45/16 (2013.01); H01L 28/20 (2013.01); H01L 29/78642 (2013.01);
Abstract

Methods for reducing location-based variations in the switching characteristics of memory cells within a memory array are described. In some cases, the resistance of an embedded resistor within each memory cell may be set to reduce the overall variation in series resistances for the memory cells within a memory array. For example, embedded resistors associated with far-far bits may be set to a lower resistance than embedded resistors associated with near-near bits. An embedded resistor may comprise a layer of polysilicon within a memory cell. Selective ion implantation may be used to reduce the embedded resistor resistance for memory cells within a particular region of the memory array and to form two or more different sets of embedded resistors within the memory array.


Find Patent Forward Citations

Kalra, Pankaj. (2016). Methods and systems to reduce location-based variations in switching characteristics of 3d reram arrays (U.S. Patent No. 9318533). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9318533

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