The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2016
Filed:
May. 04, 2012
Jerome Faist, Zürich, CH;
Gustav Schiefler, Zürich, CH;
Hans Christian Sigg, Mettmenstetten, CH;
Ralph Spolenak, Zürich, CH;
Martin Süss, Zürich, CH;
Jerome Faist, Zürich, CH;
Gustav Schiefler, Zürich, CH;
Hans Christian Sigg, Mettmenstetten, CH;
Ralph Spolenak, Zürich, CH;
Martin Süss, Zürich, CH;
PAUL SCHERRER INSTITUT, Villigen Psi, CH;
ETH ZUERICH, Zurich, CH;
Abstract
A tensile strain state in semiconductor components is adjusted. A pretensioned (tensile strain) layer is applied to a substrate (FIG., (A)). Bridge structures (FIG.(B)) are introduced in the layers by lithography and etching. The bridges are connected to the layer on both sides and are thus continuous. The geometric shape of the bridges, formed with a cross-section modulation, is determined by the windows (FIG.(C)) in the layer. When the substrate is etched selectively, the bridge is undercut through the windows. The geometric structuring of the cross-section (FIG., (D)) causes a redistribution of the originally homogeneous strain when the bridges are detached from the substrate, with the larger cross-sections relaxing at the expense of the smaller cross-sections, where the pretension is increased. Only a multiplication of stresses (or strain) originally present in the sample is possible, with the multiplication factor determined by lengths, widths and depths, and/or the relationships thereof.