The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2016

Filed:

Sep. 13, 2012
Applicants:

Masahiro Nagatani, Kudamatsu, JP;

Yoshifumi Ogawa, Hikari, JP;

Inventors:

Masahiro Nagatani, Kudamatsu, JP;

Yoshifumi Ogawa, Hikari, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 7/00 (2006.01); B05C 11/00 (2006.01); C23C 16/455 (2006.01); C23C 16/52 (2006.01); G05D 7/06 (2006.01);
U.S. Cl.
CPC ...
C23C 16/45561 (2013.01); C23C 16/52 (2013.01); G05D 7/0658 (2013.01);
Abstract

A plasma processing apparatus includes at least three gas supply lines connected to a process chamber in parallel to allow a gas to flow therethrough, and at least three flow-rate controllers provided on the gas supply lines to detect the flow rate of the gas flowing through each of the flow-rate controllers to control the flow rate to a set value and a diagnosis method. The apparatus has a function of splitting and supplying a gas controlled to a predetermined flow rate by the third flow-rate controller, to a first flow-rate controller for the smallest detectable range of the three flow-rate controllers and to a second flow-rate controller, in order to test the operation of the control of the flow rate of the first flow-rate controller, based on the value obtained from the flow rate of the gas flowing through the second flow-rate controller and the predetermined flow rate.


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