The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Jan. 29, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Kangguo Cheng, Schenectady, NY (US);

Bruce B. Doris, Slingerlands, NY (US);

Balasubramanian S. Haran, Albany, NY (US);

Ali Khakifirooz, Los Altos, CA (US);

Assignee:

GLOBALFOUNDRIES INC., Grand Cayman, KY;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/12 (2006.01); H01L 21/84 (2006.01); H01L 27/092 (2006.01); H01L 29/16 (2006.01); H01L 29/161 (2006.01); H01L 29/167 (2006.01); H01L 21/02 (2006.01); H01L 21/283 (2006.01); H01L 21/306 (2006.01); H01L 21/311 (2006.01); H01L 21/3205 (2006.01); H01L 29/06 (2006.01); H01L 29/417 (2006.01); H01L 29/45 (2006.01); H01L 29/66 (2006.01); H01L 21/033 (2006.01); H01L 21/324 (2006.01); H01L 21/8238 (2006.01);
U.S. Cl.
CPC ...
H01L 27/1203 (2013.01); H01L 21/0217 (2013.01); H01L 21/0257 (2013.01); H01L 21/02178 (2013.01); H01L 21/02181 (2013.01); H01L 21/02189 (2013.01); H01L 21/02529 (2013.01); H01L 21/02532 (2013.01); H01L 21/02592 (2013.01); H01L 21/0332 (2013.01); H01L 21/283 (2013.01); H01L 21/30604 (2013.01); H01L 21/31111 (2013.01); H01L 21/324 (2013.01); H01L 21/32053 (2013.01); H01L 21/823814 (2013.01); H01L 21/823864 (2013.01); H01L 21/84 (2013.01); H01L 27/0922 (2013.01); H01L 29/0653 (2013.01); H01L 29/16 (2013.01); H01L 29/161 (2013.01); H01L 29/167 (2013.01); H01L 29/1608 (2013.01); H01L 29/41783 (2013.01); H01L 29/45 (2013.01); H01L 29/665 (2013.01); H01L 29/6656 (2013.01); H01L 21/823807 (2013.01); H01L 21/823878 (2013.01);
Abstract

An apparatus and a method for creating a CMOS with a dual raised source and drain for NMOS and PMOS. The spacers on both stack gates are of equal thickness. In this method, a first insulating layer is formed on the surface. The first region is then masked while the other region has the first layer etched away and has an epitaxial source and drain grown on the region. A second layer is formed to all exposed surfaces. The second region is then masked while the first region is etched away. The epitaxial source and drain is formed on the first region. The second region can also be masked by adding a thin layer of undoped silicon and then oxidize it. Another way to mask the second region is to use a hard mask. Another way to form the second source and drain is to use amorphous material.


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