The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2016

Filed:

Mar. 29, 2012
Applicants:

Jiing-feng Yang, Zhubei, TW;

Chii-ping Chen, Hsin-Chu, TW;

Dian-hau Chen, Hsin-Chu, TW;

Inventors:

Jiing-Feng Yang, Zhubei, TW;

Chii-Ping Chen, Hsin-Chu, TW;

Dian-Hau Chen, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/32 (2006.01); H01L 21/337 (2006.01); H01L 21/033 (2006.01); H01L 21/311 (2006.01); H01L 21/3213 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0337 (2013.01); H01L 21/31111 (2013.01); H01L 21/31116 (2013.01); H01L 21/32139 (2013.01);
Abstract

A method of forming a semiconductor device, and a product formed thereby, is provided. The method includes forming a pattern in a mask layer using, for example, double patterning or multi-patterning techniques. The mask is treated to smooth or round sharp corners. In an embodiment in which a positive pattern is formed in the mask, the treatment may comprise a plasma process or an isotropic wet etch. In an embodiment in which a negative pattern is formed in the mask, the treatment may comprise formation of conformal layer over the mask pattern. The conformal layer will have the effect of rounding the sharp corners. Other techniques may be used to smooth or round the corners of the mask.


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