The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2016
Filed:
Aug. 06, 2013
Shi-hao Chen, Nantou County, TW;
Yung-sheng Fang, Kaohsiung, TW;
Szu-pang Mu, Hsinchu, TW;
Mango Chia-tso Chao, Hsinchu, TW;
Shi-Hao Chen, Nantou County, TW;
Yung-Sheng Fang, Kaohsiung, TW;
Szu-Pang Mu, Hsinchu, TW;
Mango Chia-Tso Chao, Hsinchu, TW;
Global Unichip Corp., Hsinchu, TW;
Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;
Abstract
A method of determining the performance of a chip of an integrated-circuit design comprises instantiating a plurality of HPM in the integrated-circuit design to generate the performance of the chip according to a performance function defined by a polynomial comprising a plurality of terms, wherein each term of the polynomial comprises an exponent of a value generated by a corresponding one of the plurality of HPM(s) and a corresponding coefficient, wherein the coefficients are determined through a regression process with sample chips of the integrated-circuit design having known performance, so that the performance of each chip other than the sample chips can be determined by the performance function and the values of the plurality of HPM(s) of the chip.