The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2016

Filed:

Oct. 14, 2013
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Hong Yu, Rexford, NY (US);

Hyucksoo Yang, Saratoga Springs, NY (US);

Richard J. Carter, Saratoga Springs, NY (US);

Assignee:

GLOBALFOUNDRIES INC., Grand Cayman, KY;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 21/336 (2006.01); H01L 21/28 (2006.01); H01L 27/092 (2006.01); H01L 27/12 (2006.01); H01L 21/84 (2006.01); H01L 21/8238 (2006.01); H01L 29/66 (2006.01); H01L 21/762 (2006.01); H01L 27/088 (2006.01);
U.S. Cl.
CPC ...
H01L 21/823821 (2013.01); H01L 21/76224 (2013.01); H01L 27/0886 (2013.01); H01L 27/0924 (2013.01); H01L 29/66795 (2013.01);
Abstract

Approaches for forming an oxide cap to protect a semiconductor device (e.g., a fin field effect transistor device (FinFET)) are provided. Specifically, approaches are provided for forming an oxide cap over a subset (e.g., SiP regions) of raised source drain (RSD) structures on the set of fins of the FinFET device to mitigate damage during subsequent processing. The oxide spacer is deposited before the removal of a nitride capping layer from the FinFET device (e.g., by a hot phosphorus wash). The oxide cap on top of the RSD structures will be preserved throughout the removal of the nitride capping layer to provide hardmask protection during this process.


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