The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 2016

Filed:

Aug. 03, 2012
Applicants:

William D. Lee, Newburyport, MA (US);

William P. Reynolds, Canton, MA (US);

Stanley W. Stone, Gloucester, MA (US);

Inventors:

William D. Lee, Newburyport, MA (US);

William P. Reynolds, Canton, MA (US);

Stanley W. Stone, Gloucester, MA (US);

Assignee:

Axcelis Technologies, Inc., Beverly, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/18 (2006.01); H01L 21/677 (2006.01); H01J 37/20 (2006.01); H01J 37/317 (2006.01); H01L 21/67 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01J 37/18 (2013.01); H01J 37/20 (2013.01); H01J 37/3171 (2013.01); H01L 21/67109 (2013.01); H01L 21/67201 (2013.01); H01L 21/67213 (2013.01); H01L 21/67742 (2013.01); H01L 21/67766 (2013.01); H01J 2237/2001 (2013.01); H01J 2237/201 (2013.01); H01J 2237/2002 (2013.01); H01J 2237/204 (2013.01); H01J 2237/2007 (2013.01); H01J 2237/31705 (2013.01); H01L 21/02002 (2013.01);
Abstract

An ion implantation system provides ions to a workpiece positioned in a vacuum environment of a process chamber on a cooled chuck. A pre-chill station within the process chamber has a chilled workpiece support configured to cool the workpiece to a first temperature, and a post-heat station within the process chamber, has a heated workpiece support configured to heat the workpiece to a second temperature. The first temperature is lower than a process temperature, and the second temperature is greater than an external temperature. A workpiece transfer arm is further configured to concurrently transfer two or more workpieces between two or more of the chuck, a load lock chamber, the pre-chill station, and the post-heat station.


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