The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 2015

Filed:

Sep. 18, 2008
Applicants:

Boris Druz, Brooklyn, NY (US);

Roger P. Fremgen, Jr., East Northport, NY (US);

Alan V. Hayes, Great Neck, NY (US);

Viktor Kanarov, Bellmore, NY (US);

Robert Krause, Levittown, NY (US);

Ira Reiss, New City, NY (US);

Piero Sferlazzo, Marblehead, MA (US);

Inventors:

Boris Druz, Brooklyn, NY (US);

Roger P. Fremgen, Jr., East Northport, NY (US);

Alan V. Hayes, Great Neck, NY (US);

Viktor Kanarov, Bellmore, NY (US);

Robert Krause, Levittown, NY (US);

Ira Reiss, New City, NY (US);

Piero Sferlazzo, Marblehead, MA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/04 (2006.01); C23C 14/22 (2006.01); H01J 37/20 (2006.01); H01J 37/302 (2006.01); H01J 37/317 (2006.01);
U.S. Cl.
CPC ...
C23C 14/044 (2013.01); C23C 14/221 (2013.01); H01J 37/20 (2013.01); H01J 37/302 (2013.01); H01J 37/317 (2013.01); H01J 2237/0245 (2013.01); H01J 2237/045 (2013.01); H01J 2237/20207 (2013.01); H01J 2237/20214 (2013.01); H01J 2237/20221 (2013.01); H01J 2237/30472 (2013.01); H01J 2237/3146 (2013.01);
Abstract

Method and apparatus for processing a substrate with an energetic particle beam. Features on the substrate are oriented relative to the energetic particle beam and the substrate is scanned through the energetic particle beam. The substrate is periodically indexed about its azimuthal axis of symmetry, while shielded from exposure to the energetic particle beam, to reorient the features relative to the major dimension of the beam.


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