The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Jun. 17, 2011
Applicants:

Yongtaek Lee, Seoul, KR;

Hyuntai Kim, Kyungki Do, KR;

Gwang Kim, Kyungki Do, KR;

Byunghoon Ahn, Kyungki-Do, KR;

Kai Liu, Phoenix, AZ (US);

Inventors:

YongTaek Lee, Seoul, KR;

HyunTai Kim, Kyungki Do, KR;

Gwang Kim, Kyungki Do, KR;

ByungHoon Ahn, Kyungki-Do, KR;

Kai Liu, Phoenix, AZ (US);

Assignee:

STATS ChipPAC, Ltd., Singapore, SG;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/28 (2006.01); H01L 23/31 (2006.01); H01L 21/56 (2006.01); H01L 25/065 (2006.01); H01L 23/64 (2006.01); H01L 23/66 (2006.01); H01L 25/16 (2006.01); H01L 23/498 (2006.01);
U.S. Cl.
CPC ...
H01L 23/3121 (2013.01); H01L 21/565 (2013.01); H01L 23/3128 (2013.01); H01L 23/645 (2013.01); H01L 23/66 (2013.01); H01L 25/0652 (2013.01); H01L 25/16 (2013.01); H01L 23/49822 (2013.01); H01L 2223/6672 (2013.01); H01L 2224/16225 (2013.01); H01L 2224/32145 (2013.01); H01L 2224/48091 (2013.01); H01L 2224/48145 (2013.01); H01L 2224/48227 (2013.01); H01L 2224/73253 (2013.01); H01L 2224/73265 (2013.01); H01L 2224/83191 (2013.01); H01L 2224/92247 (2013.01); H01L 2225/06558 (2013.01); H01L 2924/01322 (2013.01); H01L 2924/13091 (2013.01); H01L 2924/15311 (2013.01); H01L 2924/19107 (2013.01); H01L 2924/3011 (2013.01);
Abstract

A semiconductor device has a first semiconductor die containing a low pass filter and baluns. The first semiconductor die has a high resistivity substrate. A second semiconductor die including a bandpass filter is mounted to the first semiconductor die. The second semiconductor die has a gallium arsenide substrate. A third semiconductor die including an RF switch is mounted to the first semiconductor die. A fourth semiconductor die includes an RF transceiver. The first, second, and third semiconductor die are mounted to the fourth semiconductor die. The first, second, third, and fourth semiconductor die are mounted to a substrate. An encapsulant is deposited over the first, second, third, and fourth semiconductor die and substrate. A plurality of bond wires is formed between the second semiconductor die and first semiconductor die, and between the third semiconductor die and first semiconductor die, and between the first semiconductor die and substrate.


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