The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Oct. 02, 2014
Applicants:

Semiconductor Manufacturing International (Shanghai) Corporation, Shanghai, CN;

Semiconductor Manufacturing International (Beijing) Corporation, Beijing, CN;

Inventor:

Mieno Fumitake, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/808 (2006.01); H01L 29/06 (2006.01); H01L 21/8238 (2006.01); H01L 29/66 (2006.01); H01L 21/8232 (2006.01); H01L 27/098 (2006.01); H01L 27/12 (2006.01); H01L 29/10 (2006.01); H01L 29/43 (2006.01); H01L 21/265 (2006.01); H01L 21/266 (2006.01); H01L 29/49 (2006.01);
U.S. Cl.
CPC ...
H01L 21/823821 (2013.01); H01L 21/265 (2013.01); H01L 21/266 (2013.01); H01L 21/8232 (2013.01); H01L 27/098 (2013.01); H01L 27/1211 (2013.01); H01L 29/0657 (2013.01); H01L 29/1037 (2013.01); H01L 29/1066 (2013.01); H01L 29/43 (2013.01); H01L 29/4916 (2013.01); H01L 29/6656 (2013.01); H01L 29/6681 (2013.01); H01L 29/66803 (2013.01); H01L 29/66901 (2013.01); H01L 29/808 (2013.01);
Abstract

A non-planar JFET device having a thin fin structure is provided. A fin is formed projecting upwardly from or through a top surface of a substrate, where the fin has a first semiconductor layer portion formed from a first semiconductor material of a first conductivity type. The first semiconductor layer portion has a source region and a drain region, a channel region extending between the source region and the drain region. Two or more channel control regions are formed adjoining the channel region for generating charge depletion zones at and extending into the channel region for thereby controlling current conduction through the channel region. A gate is provided so as to adjoin and short together the at least two channel control regions from the outer sides of the channel control regions.


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