The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Sep. 05, 2011
Applicants:

Yumiko Kawano, Yamanashi, JP;

Susumu Arima, Yamanashi, JP;

Inventors:

Yumiko Kawano, Yamanashi, JP;

Susumu Arima, Yamanashi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/00 (2006.01); C23C 16/06 (2006.01); C23C 16/30 (2006.01); H01L 45/00 (2006.01); C23C 16/44 (2006.01); C23C 16/455 (2006.01);
U.S. Cl.
CPC ...
C23C 16/06 (2013.01); C23C 16/305 (2013.01); C23C 16/44 (2013.01); C23C 16/45523 (2013.01); H01L 45/06 (2013.01); H01L 45/144 (2013.01); H01L 45/1616 (2013.01);
Abstract

Disclosed is a method for forming a Ge—Sb—Te film, in which a substrate is disposed within a process chamber, a gaseous Ge material, a gaseous Sb material, and a Te material are introduced into the process chamber, so that a Ge—Sb—Te film formed of GeSbTeis formed on the substrate by CVD. The method for forming a Ge—Sb—Te film comprises: a step (step) wherein the gaseous Ge material and the gaseous Sb material or alternatively a small amount of the gaseous Te material not sufficient for formed of GeSbTein addition to the gaseous Ge material and the gaseous Sb material are introduced into the process chamber so that a precursor film, which does not contain Te or contains Te in an amount smaller than that in GeSbTe, is formed on the substrate; and a step (step) wherein the gaseous Te material is introduced into the process chamber and the precursor film is caused to adsorb Te, so that the Te concentration in the film is adjusted.


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