The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2015

Filed:

Mar. 03, 2015
Applicants:

Intermolecular Inc., San Jose, CA (US);

Kabushiki Kaisha Toshiba, Tokyo, JP;

Sandisk 3d Llc, Milpitas, CA (US);

Inventors:

Imran Hashim, Saratoga, CA (US);

Ryan C. Clarke, San Jose, CA (US);

Nan Lu, San Jose, CA (US);

Tim Minvielle, San Jose, CA (US);

Takeshi Yamaguchi, Kanagawa, JP;

Assignees:

Intermolecular, Inc., San Jose, CA (US);

Kabushiki Kaisha Toshiba, Tokyo, JP;

SanDisk 3D LLC, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 45/00 (2006.01); G11C 13/00 (2006.01); G11C 11/56 (2006.01);
U.S. Cl.
CPC ...
H01L 45/146 (2013.01); G11C 11/56 (2013.01); G11C 11/5685 (2013.01); G11C 13/0002 (2013.01); G11C 13/0007 (2013.01); G11C 13/0064 (2013.01); G11C 13/0069 (2013.01); G11C 13/0097 (2013.01); H01L 45/08 (2013.01); H01L 45/1233 (2013.01); H01L 45/1253 (2013.01); G11C 2213/32 (2013.01); G11C 2213/71 (2013.01); G11C 2213/77 (2013.01);
Abstract

Provided are resistive random access memory (ReRAM) cells, each having three or more resistive states and being capable of storing multiple bits of data, as well as methods of fabricating and operating such ReRAM cells. Such ReRAM cells or, more specifically, their resistive switching layer have wide range of resistive states and are capable of being very conductive (e.g., about 1 kOhm) in one state and very resistive (e.g., about 1 MOhm) in another state. In some embodiments, a resistance ratio between resistive states may be between 10 and 1,000 even up to 10,000. The resistive switching layers also allow establishing stable and distinct intermediate resistive states that may be assigned different data values. These layers may be configured to switching between their resistive states using fewer programming pulses than conventional systems by using specific materials, switching pluses, and resistive state threshold.


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