The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

Aug. 05, 2014
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Vinod R. Purayath, Los Gatos, CA (US);

Randhir Thakur, Fremont, CA (US);

Nitin K. Ingle, San Jose, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/311 (2006.01); H01L 29/66 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
H01L 21/31116 (2013.01); H01L 21/67207 (2013.01); H01L 29/66833 (2013.01);
Abstract

Methods of etching back an oxide-nitride-oxide (ONO) layer of a 3-d flash memory cell without breaking vacuum are described. The methods include recessing the two outer silicon oxide dielectric layers to expose the flanks of the thin silicon nitride layer. The silicon nitride layer is then etched back from all exposed sides to hasten the process on the same substrate processing mainframe. Both etching back the silicon oxide and etching back the silicon nitride use remotely excited fluorine-containing apparatuses attached to the same mainframe to facilitate performing both operations without an intervening atmospheric exposure. The process may also be reversed such that the silicon nitride is etched back first.


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