The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2015
Filed:
Sep. 13, 2012
Jeanne P. Bickford, Essex Junction, VT (US);
Eric A. Foreman, Faifax, VT (US);
Peter A. Habitz, Hinesburg, VT (US);
Jeffrey G. Hemmett, Bolton Valley, VT (US);
Clarence R. Ogilvie, Huntington, VT (US);
Tad J. Wilder, South Hero, VT (US);
Vladimir Zolotov, Putnam Valley, NY (US);
Jeanne P. Bickford, Essex Junction, VT (US);
Eric A. Foreman, Faifax, VT (US);
Peter A. Habitz, Hinesburg, VT (US);
Jeffrey G. Hemmett, Bolton Valley, VT (US);
Clarence R. Ogilvie, Huntington, VT (US);
Tad J. Wilder, South Hero, VT (US);
Vladimir Zolotov, Putnam Valley, NY (US);
GLOBALFOUNDRIES INC., Grand Cayman, KY;
Abstract
A plurality of digital circuits are manufactured from an identical circuit design. A power controller is operatively connected to the digital circuits, and a non-transitory storage medium is operatively connected to the power controller. The digital circuits are classified into different voltage bins, and each of the voltage bins has a current leakage limit. Each of the digital circuits has been previously tested to operate within a corresponding current leakage limit of a corresponding voltage bin into which each of the digital circuits has been classified. The non-transitory storage medium stores boundaries of the voltage bins as speed-binning test data. The power controller controls power-supply signals applied differently for each of the digital circuits based on which bin each of the digital circuit has been classified and the speed-binning test data.