The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2015

Filed:

Nov. 21, 2014
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Yezheng Tao, San Diego, CA (US);

Robert J. Rafac, Encinitas, CA (US);

Igor V. Fomenkov, San Diego, CA (US);

Daniel J. W. Brown, San Diego, CA (US);

Daniel J. Golich, San Diego, CA (US);

Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 2/00 (2006.01); G21K 5/04 (2006.01); G21K 5/08 (2006.01); H01S 3/10 (2006.01); G21K 5/02 (2006.01);
U.S. Cl.
CPC ...
H05G 2/008 (2013.01); G21K 5/02 (2013.01); H01S 3/10 (2013.01); H05G 2/005 (2013.01);
Abstract

Techniques for forming a target and for producing extreme ultraviolet light include releasing an initial target material toward a target location, the target material including a material that emits extreme ultraviolet (EUV) light when converted to plasma; directing a first amplified light beam toward the initial target material, the first amplified light beam having an energy sufficient to form a collection of pieces of target material from the initial target material, each of the pieces being smaller than the initial target material and being spatially distributed throughout a hemisphere shaped volume; and directing a second amplified light beam toward the collection of pieces to convert the pieces of target material to plasma that emits EUV light.


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