The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Jul. 28, 2011
Jhih Jie Shao, Toufen Township, Miaoli County, TW;
Tang-hsuan Chung, Kaohsiung, TW;
Szu-chia Huang, Hsinchu, TW;
Huan Chi Tseng, Hsinchu, TW;
Chien-chang Lee, Hsinchu, TW;
Yu-lan Hsiao, Shetou Township, Changhua County, TW;
Jhih Jie Shao, Toufen Township, Miaoli County, TW;
Tang-Hsuan Chung, Kaohsiung, TW;
Szu-Chia Huang, Hsinchu, TW;
Huan Chi Tseng, Hsinchu, TW;
Chien-Chang Lee, Hsinchu, TW;
Yu-Lan Hsiao, Shetou Township, Changhua County, TW;
Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;
Abstract
Provided is an apparatus for testing a semiconductor device. The apparatus includes a plurality of testing pads. The apparatus includes a plurality of testing units. The apparatus includes a switching circuit coupled between the testing pads and the testing units. The switching circuit contains a plurality of switching devices. The apparatus includes a control circuit coupled to the switching circuit. The control circuit is operable to establish electrical coupling between a selected testing unit and one or more of the testing pads by selectively activating a subset of the switching devices.