The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2015

Filed:

Aug. 28, 2014
Applicant:

Qualcomm Technologies, Inc., San Diego, CA (US);

Inventors:

Dudi Vakrat, Netanya, IL;

Noam Korem, Timrat, IL;

Victor Pinto, Zichron Ya'akov, IL;

Assignee:

QUALCOMM Technologies, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 5/357 (2011.01); G06T 5/00 (2006.01); H04N 5/217 (2011.01); H04N 5/232 (2006.01); H04N 9/64 (2006.01);
U.S. Cl.
CPC ...
H04N 5/357 (2013.01); G06T 5/00 (2013.01); G06T 5/002 (2013.01); H04N 5/217 (2013.01); H04N 5/23229 (2013.01); H04N 9/646 (2013.01);
Abstract

A noise reduction apparatus for digital cameras is presented that includes groups of one or more connected non-linear filter units. Each of the filter unit groups are driven by decimated input image data at a different level of decimation and the output of at least one of these filter unit groups serves as one of a plurality of inputs to another filter unit group driven at a different decimation level. Filtered image data from one or more filter unit groups is adaptively combined in response to one or more image metrics related to one or more local regional image characteristics.


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