The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2015
Filed:
Sep. 15, 2014
Global Unichip Corporation, Hsinchu, TW;
Taiwan Semiconductor Manufacturing Co., Ltd, Hsin-Chu, TW;
GLOBAL UNICHIP CORPORATION, Hsinchu, unknown;
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD, Hsin-Chu, unknown;
Abstract
An eye diagram measuring circuit includes a reference signal generator, a clock data recovery circuit, a test signal generator, and a boundary determining unit. The reference signal generator generates a reference signal. The clock data recovery circuit generates a clock signal according to the reference signal. The test signal generator generates a first sampling signal according to the clock signal. The test signal generator discriminates logic levels of plural bits of the input signal according to the first sampling signal and a slicing voltage, thereby generating a test signal. The boundary determining unit generates a boundary of an eye diagram according to a relationship between the test signal and the reference signal. The test signal generator changes a phase of the first sampling signal and a magnitude of the slicing voltage according to plural conditions provided by the boundary determining unit.