The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2015
Filed:
Apr. 22, 2014
Nuflare Technology, Inc., Kanagawa, JP;
Makoto Taya, Tokyo, JP;
Nobutaka Kikuiri, Tokyo, JP;
NUFLARE TECHNOLOGY, INC., Kanagawa, JP;
Abstract
An inspection apparatus comprising, a light source configured to emit an inspection light, a table configured to mount an inspection target thereon, an illumination optical system configured to direct the inspection light from the light source toward the target, an objective lens unit configured to gather transmitting or reflected light generated after the illumination optical system illuminates the target with the inspection light, a light receiving unit configured to capture an optical image formed from the light illuminated through the objective lens unit, a chamber configured to house the table, light receiving unit, illumination optical system and objective lens unit, a temperature adjustment unit configured to adjust a temperature in the chamber, and a gas supply unit configured to be connected to the objective lens unit to supply an inert gas at a predetermined temperature into the unit.