The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2015

Filed:

May. 16, 2014
Applicant:

Fujifilm Corporation, Minato-Ku, Tokyo, JP;

Inventors:

Keita Kato, Haibara-gun, JP;

Michihiro Shirakawa, Haibara-gun, JP;

Hidenori Takahashi, Haibara-gun, JP;

Sou Kamimura, Haibara-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/004 (2006.01); G03F 7/32 (2006.01); G03F 7/038 (2006.01); H01L 21/027 (2006.01); G03F 7/039 (2006.01); C08F 220/18 (2006.01);
U.S. Cl.
CPC ...
G03F 7/0388 (2013.01); C08F 220/18 (2013.01); G03F 7/0392 (2013.01); G03F 7/0397 (2013.01); G03F 7/325 (2013.01); H01L 21/0274 (2013.01);
Abstract

A pattern forming method including: (i) forming a film using an actinic ray-sensitive or radiation-sensitive resin composition containing a resin (A) having a repeating unit having a group generating a polar group upon being decomposed by the action of an acid, and a repeating unit having an aromatic group, a compound (B) generating an acid upon irradiation with actinic rays or radiation, and a solvent (C); (ii) exposing the film; and (iii) developing the exposed film using a developer including an organic solvent to form a negative tone pattern, wherein the resin (A) is a resin having a repeating unit having a naphthyl group, and the like, and/or the actinic ray-sensitive or radiation-sensitive resin composition contains a compound (D) having a naphthalene ring, and the like.


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