The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Feb. 05, 2014
Applicant:

Advanced Ion Beam Technology, Inc., Hsin-Chu, TW;

Inventor:

Zhimin Wan, Sunnyvale, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/425 (2006.01); H01J 37/317 (2006.01); H01L 21/265 (2006.01); H01J 37/302 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01J 37/3171 (2013.01); H01J 37/302 (2013.01); H01L 21/26513 (2013.01); H01J 2237/047 (2013.01); H01J 2237/30472 (2013.01); H01L 21/26586 (2013.01); H01L 29/66803 (2013.01);
Abstract

In a multi-energy ion implantation process, an ion implanting system having an ion source, an extraction assembly, and an electrode assembly is used to implant ions into a target. An ion beam having a first energy may be generated using the ion source and the extraction assembly. A first voltage may be applied across the electrode assembly. The ion beam may enter the electrode assembly at the first energy, exit the electrode assembly at a second energy, and implant ions into the target at the second energy. A second voltage may be applied across the electrode assembly. The ion beam may enter the electrode assembly at the first energy, exit the electrode assembly at a third energy, and implants ions into the target at the third energy. The third energy may be different from the second energy.


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