The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2015

Filed:

Oct. 01, 2010
Applicants:

Ferdinand Scholz, Ulm, DE;

Peter Brückner, Tettnang, DE;

Frank Habel, Freiberg, DE;

Matthias Peter, Alteglofsheim, DE;

Klaus Köhler, Freiburg, DE;

Inventors:

Ferdinand Scholz, Ulm, DE;

Peter Brückner, Tettnang, DE;

Frank Habel, Freiberg, DE;

Matthias Peter, Alteglofsheim, DE;

Klaus Köhler, Freiburg, DE;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); C30B 29/40 (2006.01); C30B 25/02 (2006.01);
U.S. Cl.
CPC ...
C30B 29/406 (2013.01); C30B 25/02 (2013.01); H01L 21/0242 (2013.01); H01L 21/0254 (2013.01); H01L 21/0262 (2013.01); H01L 21/02433 (2013.01); Y10S 117/915 (2013.01); Y10T 428/24355 (2015.01);
Abstract

An epitaxial growth process for producing a thick III-N layer, wherein III denotes at least one element of group III of the periodic table of elements, is disclosed, wherein a thick III-N layer is deposited above a foreign substrate. The epitaxial growth process preferably is carried out by HVPE. The substrate can also be a template comprising the foreign substrate and at least one thin III-N intermediate layer. The surface quality is improved by providing a slight intentional misorientation of the substrate, and/or a reduction of the N/III ratio and/or the reactor pressure towards the end of the epitaxial growth process. Substrates and semiconductor devices with such improved III-N layers are also disclosed.


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