The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2015
Filed:
Aug. 22, 2014
Applicant:
Tokyo Electron Limited, Minato-ku, Tokyo, JP;
Inventors:
Martin Kent, Andover, MA (US);
Eric J. Strang, Driftwood, TX (US);
Assignee:
Tokyo Electron Limited, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C03C 25/68 (2006.01); C23F 1/02 (2006.01); H01L 21/306 (2006.01); H01L 21/02 (2006.01); H01L 21/033 (2006.01); H01L 21/311 (2006.01); H01L 21/67 (2006.01); C01B 7/19 (2006.01); C09K 13/08 (2006.01); C23F 1/12 (2006.01); H01L 21/687 (2006.01);
U.S. Cl.
CPC ...
C23F 1/02 (2013.01); C01B 7/191 (2013.01); C09K 13/08 (2013.01); C23F 1/12 (2013.01); H01L 21/02049 (2013.01); H01L 21/0337 (2013.01); H01L 21/0338 (2013.01); H01L 21/30621 (2013.01); H01L 21/31116 (2013.01); H01L 21/67069 (2013.01); H01L 21/67248 (2013.01); H01L 21/67109 (2013.01); H01L 21/68742 (2013.01);
Abstract
A dry non-plasma treatment system and method for removing oxide material is described. The treatment system is configured to provide chemical treatment of one or more substrates, wherein each substrate is exposed to a gaseous chemistry under controlled conditions including surface temperature and gas pressure. Furthermore, the treatment system is configured to provide thermal treatment of each substrate, wherein each substrate is thermally treated to remove the chemically treated surfaces on each substrate.