The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2015
Filed:
Jul. 15, 2013
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Jing Ling, Fremont, CA (US);
Soowan Suh, San Ramon, CA (US);
Juan-Carlos Calderon, Fremont, CA (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/06 (2006.01); H04J 3/06 (2006.01); H04L 12/861 (2013.01); H04L 12/879 (2013.01); H04L 12/935 (2013.01);
U.S. Cl.
CPC ...
G06F 12/06 (2013.01); H04J 3/0623 (2013.01); H04L 49/90 (2013.01); H04L 49/901 (2013.01); H04J 2203/0094 (2013.01); H04L 49/30 (2013.01);
Abstract
In one embodiment, a method includes recording, for each of a plurality of data frames, a virtual write address including a multiframe indicator and a byte number indicator; and reading a group of associated data frames identified by corresponding multiframe indicators and byte number indicators. The reading is based on determining a minimum write address from a plurality of physical write addresses in the group of associated data frames by comparing virtual write addresses of all members in the group.