The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2015

Filed:

Oct. 12, 2012
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Randall M. Burnett, II, Fishkill, NY (US);

Hanyi Ding, Colchester, VT (US);

Kai D. Feng, Hopewell Junction, NY (US);

Donald J. Papae, Hopewell Junction, NY (US);

Francis F. Szenher, Fihskill, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/40 (2006.01); G01R 29/08 (2006.01); G01S 3/02 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0821 (2013.01); G01S 3/023 (2013.01); G01S 2007/4086 (2013.01);
Abstract

A radiation signal measurement system for millimeter wave transceivers is disclosed. Embodiments of the present invention utilize a laser to align the laser with an antenna. The transceiver is then moved into the path of the laser to align the laser with the transceiver. The transceiver or antenna orientation is changed such that the transceiver and antenna face each other, in an aligned position. Millimeter wave absorber material is applied to the inside and outside of the testing chamber to minimize reflections and interference from outside sources.


Find Patent Forward Citations

Loading…