The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2015

Filed:

Dec. 26, 2012
Applicant:

Shin-etsu Handotai Co., Ltd., Tokyo, JP;

Inventors:

Norihiro Kobayashi, Takasaki, JP;

Toru Ishizuka, Takasaki, JP;

Hiroji Aga, Takasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/762 (2006.01); H01L 21/225 (2006.01); H01L 21/311 (2006.01); H01L 21/324 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76254 (2013.01); H01L 21/2253 (2013.01); H01L 21/2255 (2013.01); H01L 21/31111 (2013.01); H01L 21/3247 (2013.01);
Abstract

The present invention is directed to a method for manufacturing an SOI wafer in which the bonded SOI wafer after the delamination by the ion implantation delamination method is subjected to a rapid thermal oxidation process such that an oxide film is formed on a surface of the SOI layer, the oxide film is removed, the bonded SOI wafer is then subjected to a flattening heat treatment to flatten the surface of the SOI layer, the flattening heat treatment causing migration of silicon atoms of the surface of the SOI layer, and the bonded SOI wafer is then subjected to a sacrificial oxidation process to adjust a film thickness of the SOI layer. The method enables efficient manufacture of a high quality SOI wafer having an SOI layer with sufficiently reduced surface roughness of the SOI layer surface and fewer deep pits in the SOI layer surface.


Find Patent Forward Citations

Loading…