The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2015

Filed:

Aug. 22, 2012
Applicants:

Zhiwei Gong, Chandler, AZ (US);

Michael B Vincent, Chandler, AZ (US);

Scott M Hayes, Chandler, AZ (US);

Jason R Wright, Chandler, AZ (US);

Inventors:

Zhiwei Gong, Chandler, AZ (US);

Michael B Vincent, Chandler, AZ (US);

Scott M Hayes, Chandler, AZ (US);

Jason R Wright, Chandler, AZ (US);

Assignee:

FREESCALE SEMICONDUCTOR INC., Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/30 (2006.01); H01L 23/538 (2006.01); H01L 21/78 (2006.01); H01L 23/48 (2006.01); H01L 23/31 (2006.01); H01L 23/498 (2006.01); H01L 21/56 (2006.01); H01L 25/10 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 23/5389 (2013.01); H01L 21/561 (2013.01); H01L 21/78 (2013.01); H01L 23/3128 (2013.01); H01L 23/48 (2013.01); H01L 23/49805 (2013.01); H01L 24/24 (2013.01); H01L 24/82 (2013.01); H01L 24/96 (2013.01); H01L 25/105 (2013.01); H01L 23/49838 (2013.01); H01L 24/48 (2013.01); H01L 2224/24145 (2013.01); H01L 2224/48091 (2013.01); H01L 2924/00014 (2013.01); H01L 2924/1461 (2013.01); H01L 2924/18165 (2013.01);
Abstract

Embodiments of a method for fabricating stacked microelectronic packages are provided, as are embodiments of a stacked microelectronic package. In one embodiment, the method includes arranging microelectronic device panels in a panel stack. Each microelectronic device panel includes a plurality of microelectronic devices and a plurality of package edge conductors extending therefrom. Trenches are formed in the panel stack exposing the plurality of package edge conductors. An electrically-conductive material is deposited into the trenches and contacts the plurality of package edge conductors exposed therethrough. The panel stack is then separated into partially-completed stacked microelectronic packages. For at least one of the partially-completed stacked microelectronic packages, selected portions of the electrically-conductive material are removed to define a plurality of patterned sidewall conductors interconnecting the microelectronic devices included within the stacked microelectronic package.


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