The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2015

Filed:

Jan. 25, 2011
Applicants:

Yasuo Hibino, Shiki, JP;

Tomonori Umezaki, Ube, JP;

Akiou Kikuchi, Ube, JP;

Isamu Mori, Tokyo, JP;

Satoru Okamoto, Fujimino, JP;

Inventors:

Yasuo Hibino, Shiki, JP;

Tomonori Umezaki, Ube, JP;

Akiou Kikuchi, Ube, JP;

Isamu Mori, Tokyo, JP;

Satoru Okamoto, Fujimino, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C09K 13/00 (2006.01); C09K 13/04 (2006.01); C09K 13/08 (2006.01); B44C 1/22 (2006.01); C03C 15/00 (2006.01); C03C 25/68 (2006.01); C23F 1/00 (2006.01); C23F 3/00 (2006.01); H01L 21/311 (2006.01);
U.S. Cl.
CPC ...
H01L 21/31116 (2013.01); C09K 13/00 (2013.01);
Abstract

A dry etching agent according to the present invention contains (A) a fluorinated propyne represented by the chemical formula: CFC≡CX where X is H, F, Cl, Br, I, CH, CFHor CFH; and either of: (B) at least one kind of gas selected from the group consisting of O, O, CO, CO, COCland COF; (C) at least one kind of gas selected from the group consisting of F, NF, Cl, Br, Iand YFn where Y is Cl, Br or I; and n is an integer of 1 to 5; and (D) at least one kind of gas selected from the group consisting of CF, CHF, CF, CFH, CFH, CF, CFH, CClFH and CF. This dry etching agent has a small environmental load and a wide process window and can be applied for high-aspect-ratio processing without special operations such as substrate excitation.


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