The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2015

Filed:

Feb. 02, 2013
Applicant:

Sandisk Technologies Inc., Plano, TX (US);

Inventors:

Nian Niles Yang, Mountain View, CA (US);

Chris Avila, Saratoga, CA (US);

Steven Sprouse, San Jose, CA (US);

Jianmin Huang, San Carlos, CA (US);

Yichao Huang, San Jose, CA (US);

Kulachet Tanpairoj, Santa Clara, CA (US);

Assignee:

SANDISK TECHNOLOGIES INC., Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1072 (2013.01);
Abstract

A method performed in a data storage device including a non-volatile memory includes reading a representation of data, the representation corresponding to one or more selected states of storage elements of a group of storage elements of the non-volatile memory. The method includes, in response to a count of errors in the representation of the data exceeding a threshold, scheduling a remedial action to be performed on the group of storage elements.


Find Patent Forward Citations

Yang, Nian. (2015). Inspection of non-volatile memory for disturb effects (U.S. Patent No. 9063879). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9063879

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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