The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2015

Filed:

Jun. 26, 2014
Applicants:

Nelson Garces, Alexandria, VA (US);

Virginia D. Wheeler, Alexandria, VA (US);

David Kurt Gaskill, Alexandria, VA (US);

Charles R. Eddy, Jr., Columbia, MD (US);

Glenn G. Jernigan, Waldorf, MD (US);

Inventors:

Nelson Garces, Alexandria, VA (US);

Virginia D. Wheeler, Alexandria, VA (US);

David Kurt Gaskill, Alexandria, VA (US);

Charles R. Eddy, Jr., Columbia, MD (US);

Glenn G. Jernigan, Waldorf, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); C23C 16/02 (2006.01); C23C 16/40 (2006.01); C23C 16/455 (2006.01); B82Y 30/00 (2011.01); B82Y 40/00 (2011.01); C30B 25/18 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02315 (2013.01); C23C 16/02 (2013.01); C23C 16/403 (2013.01); C23C 16/45525 (2013.01); B82Y 30/00 (2013.01); B82Y 40/00 (2013.01); C30B 25/186 (2013.01);
Abstract

Processes for preparation of an epitaxial graphene surface to make it suitable for deposition of high-κ oxide-based dielectric compounds such as AlO, HfO, TaO, or TiOare provided. A first process combines ex situ wet chemistry conditioning of an epitaxially grown graphene sample with an in situ pulsing sequence in the ALD reactor. A second process combines ex situ dry chemistry conditioning of the epitaxially grown graphene sample with the in situ pulsing sequence.


Find Patent Forward Citations

Loading…