The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

May. 07, 2012
Applicants:

Jun Yashima, Kanagawa, JP;

Akihito Anpo, Tokyo, JP;

Inventors:

Jun Yashima, Kanagawa, JP;

Akihito Anpo, Tokyo, JP;

Assignee:

NuFlare Technolgy, Inc., Numazu-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B82Y 10/00 (2011.01); H01J 37/304 (2006.01); H01J 37/317 (2006.01); B82Y 40/00 (2011.01);
U.S. Cl.
CPC ...
H01J 37/3174 (2013.01); B82Y 10/00 (2013.01); B82Y 40/00 (2013.01); H01J 2237/31776 (2013.01); H01J 2237/304 (2013.01); H01J 2237/31762 (2013.01); H01J 2237/31764 (2013.01);
Abstract

A charged particle beam writing apparatus includes a unit to divide a chip region into first data processing blocks, a unit to, in each block, extract a cell whose reference position is located in the block concerned from cells each including at least one figure pattern, a unit to, for each block, generate a first frame that surrounds the block concerned and the cell extracted, a unit to, for each first frame, divide the inside of the first frame concerned into mesh regions and calculate an area density of a figure pattern in each mesh, a unit to combine area densities of mesh regions which are overlapped with each other and between different first frames, a unit to calculate a dose of beam by using the area density, and a unit to write a pattern on a target workpiece by irradiating the beam of the dose calculated.


Find Patent Forward Citations

Loading…