The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Sep. 30, 2011
Applicants:

Matthew Graham, San Diego, CA (US);

Steven Chang, San Diego, CA (US);

Jim Crouch, San Diego, CA (US);

Igor Fomenkov, San Diego, CA (US);

Inventors:

Matthew Graham, San Diego, CA (US);

Steven Chang, San Diego, CA (US);

Jim Crouch, San Diego, CA (US);

Igor Fomenkov, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/42 (2006.01); G03F 7/20 (2006.01); H05G 2/00 (2006.01); G01J 1/16 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70033 (2013.01); H05G 2/003 (2013.01); H05G 2/008 (2013.01);
Abstract

An apparatus includes a drive laser system producing an amplified light beam of pulses that travels along a drive axis; a beam delivery system that directs the amplified light beam of pulses toward a target region; a target material delivery system that provides a target mixture containing a target material in the target region; two or more sensors radially separated from a main axis that crosses the target region, the two or more sensors being configured to detect energy of ultraviolet electromagnetic radiation emitted from a plasma state of the target material when the amplified light beam of pulses intersects the target mixture; and a controller that receives the output from the two or more sensors. The controller is configured to estimate a relative radial alignment between the target mixture and the drive axis within the target region based on an analysis of the detected energy.


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