The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

Jun. 18, 2012
Applicants:

Eugene Y. Ivanov, Grove City, OH (US);

Yongwen Yuan, Dublin, OH (US);

David B. Smathers, Columbus, OH (US);

Ronald G. Jordan, Sugar Grove, OH (US);

Inventors:

Eugene Y. Ivanov, Grove City, OH (US);

Yongwen Yuan, Dublin, OH (US);

David B. Smathers, Columbus, OH (US);

Ronald G. Jordan, Sugar Grove, OH (US);

Assignee:

Tosoh SMD, Inc., Grove City, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/06 (2006.01); C23C 14/34 (2006.01); H01J 37/32 (2006.01); H01J 37/34 (2006.01);
U.S. Cl.
CPC ...
C23C 14/3414 (2013.01); H01J 37/3255 (2013.01); H01J 37/3426 (2013.01); C23C 14/0617 (2013.01); H01L 2924/0002 (2013.01);
Abstract

A sputtering target made of aluminum and one or more alloying elements including Ni, Co, Ti, V, Cr, Mn, Mo, Nb, Ta, W, and rare earth metals (REM). The addition of very small amounts of alloying element to pure aluminum and aluminum alloy target improves the uniformity of the deposited wiring films through affecting the target's recrystallization process. The range of alloying element content is 0.01 to 100 ppm by weight, which is sufficient to prevent dynamic recrystallization of pure aluminum and aluminum alloys, such as 30 ppm Si alloy. The addition of small amount of alloying elements increases the thermal stability and electromigration resistance of pure aluminum and aluminum alloys thin films while sustaining their low electrical resistivity and good etchability. This invention also provides a method of manufacturing microalloyed aluminum and aluminum alloy sputtering target.


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