The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Mar. 27, 2009
Applicant:

Ghassem Azdasht, Berlin, DE;

Inventor:

Ghassem Azdasht, Berlin, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01); G01R 1/073 (2006.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07342 (2013.01); G01R 1/06733 (2013.01);
Abstract

The invention relates to a test contact arrangement () for testing semiconductor components, comprising at least one test contact () which is arranged in a test contact frame () and is designed in the type of a cantilever arm and which has a fastening base () and a contact arm () which is provided with a contact tip () and which is connected to the fastening base, wherein the fastening base is inserted with a fastening projection () thereof into a frame opening () of the test contact frame in such a manner that a lower edge () of the fastening projection is essentially aligned flush with a lower side () of the test contact frame.


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