The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Apr. 25, 2012
Applicants:

Hiroji Aga, Annaka, JP;

Isao Yokokawa, Annaka, JP;

Nobuhiko Noto, Annaka, JP;

Inventors:

Hiroji Aga, Annaka, JP;

Isao Yokokawa, Annaka, JP;

Nobuhiko Noto, Annaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/265 (2006.01); H01L 29/02 (2006.01); H01L 21/687 (2006.01); H01L 21/762 (2006.01);
U.S. Cl.
CPC ...
H01L 29/02 (2013.01); H01L 21/26586 (2013.01); H01L 21/68764 (2013.01); H01L 21/68771 (2013.01); H01L 21/76254 (2013.01); H01L 21/265 (2013.01); Y10S 438/977 (2013.01);
Abstract

A method for manufacturing a bonded wafer includes: an ion implantation step of using a batch type ion implanter; a bonding step of bonding an ion implanted surface of a bond wafer to a surface of a base wafer directly or through an insulator film; and a delamination step of delaminating the bond wafer at an ion implanted layer, thereby manufacturing a bonded wafer having a thin film on the base wafer, wherein the ion implantation into the bond wafer carried out at the ion implantation step is divided into a plurality of processes, the bond wafer is rotated on its own axis a predetermined rotation angle after each ion implantation, and the next ion implantation is carried out at an arrangement position obtained by the rotation.


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