The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2015
Filed:
Sep. 30, 2013
Shanghai Huali Microelectronics Corporation, Shanghai, CN;
Yi Ding, Shanghai, CN;
Minghua Zhang, Shanghai, CN;
Jingxun Fang, Shanghai, CN;
Junhua Yan, Shanghai, CN;
Shanghai Huali Microelectronics Corporation, Shanghai, CN;
Abstract
A method of forming strained source and drain regions in a P-type FinFET structure is disclose. The method comprises depositing an isolation layer on the FinFET structure; applying a lithography and etching process to expose the isolation layer in two areas on opposite sides of the gate over the source/drain region of the FinFET, and etching through the exposed isolation layer to expose the semiconductive material of the source/drain region in the two areas; forming a recess in each of the source/drain region from the exposed semiconductive material; selectively epitaxially growing another semiconductive material in the recesses to increase the source/drain strain; and removing the rest of the isolation layer.