The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Mar. 14, 2011
Applicants:

Hidetoshi Asamura, Ibaraki, JP;

Keisuke Kawamura, Matsumoto, JP;

Satoshi Obara, Funabashi, JP;

Inventors:

Hidetoshi Asamura, Ibaraki, JP;

Keisuke Kawamura, Matsumoto, JP;

Satoshi Obara, Funabashi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 29/36 (2006.01); H01L 21/02 (2006.01); C30B 25/02 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0262 (2013.01); Y10T 428/24355 (2015.01); C30B 25/02 (2013.01); C30B 29/36 (2013.01); H01L 21/0237 (2013.01); H01L 21/02447 (2013.01); H01L 21/02494 (2013.01); H01L 21/02529 (2013.01); H01L 21/02614 (2013.01); H01L 21/02661 (2013.01);
Abstract

To provide a method of manufacturing a single crystal 3C-SiC substrate that can dramatically reduce surface defects generated in a processing of epitaxial growth and can secure a quality as a semiconductor device while simplifying a post process. The method of manufacturing a single crystal 3C-SiC substrate where a single crystal 3C-SiC layer is formed on a base substrate by epitaxial growth is provided. A first growing stage of forming the single crystal 3C-SiC layer to have a surface state configured with a surface with high flatness and surface pits scattering in the surface is performed. A second growing stage of further epitaxially growing the single crystal 3C-SiC layer obtained in the first growing stage so as to fill the surface pits is performed.


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