The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2015

Filed:

Dec. 30, 2010
Applicants:

Omri Hayner, Kfar Hogla, IL;

Itay Grushka, Shoham, IL;

Inventors:

Omri Hayner, Kfar Hogla, IL;

Itay Grushka, Shoham, IL;

Assignee:

Nice-Systems Ltd., Ra'anana, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/048 (2013.01); G06F 11/34 (2006.01); G06F 3/01 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3409 (2013.01); G06F 3/048 (2013.01); G06F 11/3438 (2013.01); G06F 11/3476 (2013.01); G06F 2201/80 (2013.01); G06F 2201/86 (2013.01); G06F 2201/875 (2013.01);
Abstract

A computer-implemented method for assessing the quality of performance of agents engaged in customer-representative interaction-related sessions is provided. The method includes capturing screen events of a computational representative to form a captured event, wherein the screen event is a graphical user interface (GUI) element shown on a screen coupled to the computational device; parsing the captured event according to one or more criteria to obtain screen event data that contains text; triggering recording of screen data associated with the computational device, if the screen event data matches a user defined text search criterion; and performing computer-based automated quality measurement analysis based on the screen event data.


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