The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8977034 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 10, 2015

Filed:

Jun. 29, 2010
Applicants:

Yasutaka Toyoda, Mito, JP;

Ryoichi Matsuoka, Yotsukaido, JP;

Inventors:

Yasutaka Toyoda, Mito, JP;

Ryoichi Matsuoka, Yotsukaido, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01B 15/04 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
G01B 15/04 (2013.01); H01L 22/12 (2013.01);
Abstract

An image of the joint portion of circuit patterns manufactured using a design pattern for double patterning is read out. Target boundary lines and evaluation regions are set on the image. In the evaluation regions, image processing is performed along the directions of the target boundary lines. Furthermore, binarization processing is performed. A decision is made based on an image obtained in this way as to whether the patterns have defects.


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Toyoda, Yasutaka. (2015). Pattern shape evaluation method and pattern shape evaluation apparatus (U.S. Patent No. 8977034). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8977034

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