The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2015

Filed:

Sep. 09, 2011
Applicants:

Ludovic Godet, Boston, MA (US);

Patrick M. Martin, Ipswich, MA (US);

Joseph C. Olson, Beverly, MA (US);

Andrew J. Hornak, York, ME (US);

Inventors:

Ludovic Godet, Boston, MA (US);

Patrick M. Martin, Ipswich, MA (US);

Joseph C. Olson, Beverly, MA (US);

Andrew J. Hornak, York, ME (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/302 (2006.01); H01L 21/027 (2006.01); H01J 37/32 (2006.01); G03F 7/40 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0273 (2013.01); H01J 37/32422 (2013.01); G03F 7/40 (2013.01);
Abstract

A method of reducing roughness in an opening in a surface of a resist material disposed on a substrate, comprises generating a plasma having a plasma sheath and ions therein. The method also includes modifying a shape of a boundary defined between the plasma and the plasma sheath with a plasma sheath modifier so that a portion of the boundary facing the resist material is not parallel to a plane defined by the surface of the substrate. The method also includes providing a first exposure of ions while the substrate is in a first position, the first exposure comprising ions accelerated across the boundary having the modified shape toward the resist material over an angular range with respect to the surface of the substrate.


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